Sfoglia per Autore
X-ray diffraction characterization of iridium dioxide electrocatalysts
1991-01-01 Benedetti, Alvise; Polizzi, Stefano; Riello, Pietro; DE BATTISTI, A; Maldotti, A.
XRD investigation of the crystallization process in Fe40Ni40B20 metallic glass
1992-01-01 Fagherazzi, Giuliano; Polizzi, Stefano; Riello, Pietro; Benedetti, Alvise
STRUCTURAL CHARACTERIZATION OF CD(SE, S)-DOPED GLASSES
1992-01-01 Fagherazzi, Giuliano; Riello, Pietro; Righini, G. C.
Complete sets of factors for absorption correction and air scattering subtraction in X-ray powder diffraction of loosely packed samples
1993-01-01 Ottani, S.; Riello, Pietro; Polizzi, Stefano
FRACTAL PROPERTIES OF A PARTIALLY CRYSTALLINE ZIRCONIUM-OXIDE AEROGEL
1993-01-01 Benedetti, Alvise; Fagherazzi, Giuliano; Riello, Pietro; Zeng, Y. W.; Pinna, Francesco; Signoretto, Michela
SHORT-RANGE STRUCTURE OF ZIRCONIA XEROGEL AND AEROGEL, DETERMINED BY WIDE-ANGLE X-RAY-SCATTERING
1993-01-01 Zeng, Y. W.; Fagherazzi, Giuliano; Pinna, Francesco; Polizzi, Stefano; Riello, Pietro; Signoretto, Michela
SAXS study of the micro-inhomogeneity of industrial soda lime silica glass
1994-01-01 Benedetti, Alvise; GEOTTI BIANCHINI, F.; Fagherazzi, Giuliano; Riello, Pietro; Albertini, G.; DE RIU, L.
Physicochemical properties of thermally prepared Ti-supported IrO2+ ZrO2 electrocatalysts
1994-01-01 Benedetti, Alvise; Riello, Pietro; Battaglin, Giancarlo; DE BATTISTI, A.; Barbieri, A.
A semi-empirical asymmetry function for x-ray diffraction peak profiles
1995-01-01 Riello, Pietro; Canton, Patrizia; Fagherazzi, Giuliano
X-ray Rietveld analysis with a physically based background
1995-01-01 Riello, Pietro; Fagherazzi, Giuliano; Clemente, D.; Canton, Patrizia
Fractal model of amorphous and semicrystalline nano-sized zirconia aerogels
1995-01-01 Zeng, Y. W.; Riello, Pietro; Benedetti, Alvise; Fagherazzi, Giuliano
Determining the degree of crystallinity in semicrystalline materials by means of the Rietveld analysis
1995-01-01 Riello, Pietro; Fagherazzi, Giuliano; Canton, Patrizia; Clemente, D.; Signoretto, Michela
Small angle scattering of a polydisperse system of interacting hard spheres: an analytical solution
1997-01-01 Riello, Pietro; Benedetti, Alvise
ASAXS investigation of a Au/C catalyst
1997-01-01 Benedetti, Alvise; Polizzi, Stefano; Riello, Pietro; Pinna, Francesco; Goerigk, G.
TWO-DIMENSIONAL SMALL-ANGLE X-RAY SCATTERING INVESTIGATION OF STRETCHED BOROSILICATE GLASSES
1997-01-01 Polizzi, Stefano; Riello, Pietro; Fagherazzi, Giuliano; Bark, M.; Borrelli, N. F.
Redrawn phase-separated Borosilicate Glasses: a TEM Investigation
1997-01-01 Polizzi, Stefano; Armigliato, A.; Riello, Pietro; Borrelli, N. F.; Fagherazzi, Giuliano
Calibration of the Monochromator band-pass function for the X-Ray Rietveld analysis
1997-01-01 Riello, Pietro; Canton, Patrizia; Fagherazzi, Giuliano
Quantitative phase analysis in semicrystalline materials using the Rietveld method.
1998-01-01 Riello, Pietro; Canton, Patrizia; Fagherazzi, Giuliano
Au/C catalyst: Experimental evidence of the coexistence of nanoclusters and larger Au particles
1998-01-01 Riello, Pietro; Canton, Patrizia; Benedetti, Alvise
The microstructure of borosilicate glasses containing elongated and oriented phase-separated crystalline particles
1998-01-01 Polizzi, Stefano; Riello, Pietro; Fagherazzi, Giuliano; Borrelli, N. F.
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