Experimental data on the stress-induced birefringence in Ag+-Na+ ion-exchanged monomode waveguides are presented. From accurate measurements of modal birefringence and in-depth silver distribution, it is possible to reconstruct the birefringence profile, and give an estimation of the stress built up in the exchanged layer. © 1992 Taylor and Francis Ltd.

Stress-induced birefringence in silver-diffused glass waveguides

GONELLA, Francesco;
1992-01-01

Abstract

Experimental data on the stress-induced birefringence in Ag+-Na+ ion-exchanged monomode waveguides are presented. From accurate measurements of modal birefringence and in-depth silver distribution, it is possible to reconstruct the birefringence profile, and give an estimation of the stress built up in the exchanged layer. © 1992 Taylor and Francis Ltd.
1992
39
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10278/35954
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